1 files changed, 162 insertions, 0 deletions
diff --git a/inc/platform/test_mode.h b/inc/platform/test_mode.h
new file mode 100644
index 0000000..3aa94c7
--- /dev/null
+++ b/inc/platform/test_mode.h
@@ -0,0 +1,162 @@
+/**
+****************************************************************************************************
+*               Copyright(c) 2017, Realtek Semiconductor Corporation. All rights reserved.
+****************************************************************************************************
+* @file     test_mode.h
+* @brief    test mode definition.
+* @author   Serval Li
+* @date     2017-08-29
+* @version  v1.0
+****************************************************************************************************
+*/
+
+#ifndef _TEST_MODE_H_
+#define _TEST_MODE_H_
+
+#include <stdint.h>
+#include <stdbool.h>
+#include "rtl876x.h"
+#include "rtl876x_wdg.h"
+#include "patch_header_check.h"
+#include "flash_device.h"
+
+#ifdef __cplusplus
+extern "C" {
+#endif
+
+/** @defgroup TEST_MODE    Test Mode
+  * @{
+  */
+
+/*============================================================================*
+  *                                   Macros
+  *============================================================================*/
+/** @defgroup TEST_MODE_Exported_Macros Test Mode Exported Macros
+  * @brief
+  * @{
+  */
+/* ascii value of "test" */
+#define TEST_MODE_FLAG_DEFAULT                        0x74657374
+#define TEST_MODE_FLAG_DISABLE                        0x50245150
+
+/* General Purpose FW register */
+#define BTAON_FAST_TEST_MODE                          0x16
+/** End of TEST_MODE_Exported_Macros
+  * @}
+  */
+
+/*============================================================================*
+  *                                   Types
+  *============================================================================*/
+/** @defgroup TEST_MODE_Exported_Types Test Mode Exported Types
+  * @brief
+  * @{
+  */
+
+/* 0x16 (BTAON_FAST_TEST_MODE) */
+typedef union
+{
+    uint16_t d16;
+    struct
+    {
+        uint8_t rsvd                      : 5;            /* bit[4:0]: reserved for ROM code */
+        uint8_t test_mode                 : 3;            /* bit[7:5]: test mode */
+        uint8_t reset_reason              : 8;            /* bit[15:8]: reset reason  */
+    } s;
+} T_BTAON_FAST_TEST_MODE_TYPE;
+
+typedef enum
+{
+    NOT_TEST_MODE       = 0,
+    DIRECT_TEST_MODE    = 1,
+    SINGLE_TONE_MODE    = 2,
+    AUTO_PAIR_WITH_FIX_ADDR_MODE    = 3,
+    DATA_UART_TEST_MODE = 4,
+    WRISTBAND_TEST_MODE = 5,
+    MOUSE_TEST_MODE = 6,
+    //add more
+} T_TEST_MODE;
+/** End of TEST_MODE_Exported_Types
+  * @}
+  */
+
+/*============================================================================*
+  *                                Functions
+  *============================================================================*/
+/** @defgroup TEST_MODE_Exported_Functions Test Mode Exported Functions
+    * @brief
+    * @{
+    */
+static inline T_TEST_MODE get_test_mode(void)
+{
+    T_BTAON_FAST_TEST_MODE_TYPE aon;
+    aon.d16 = btaon_fast_read_safe(BTAON_FAST_TEST_MODE);
+    return (T_TEST_MODE)(aon.s.test_mode);
+}
+
+static inline void switch_to_test_mode(T_TEST_MODE test_mode)
+{
+    T_BTAON_FAST_TEST_MODE_TYPE aon;
+    aon.d16 = btaon_fast_read_safe(BTAON_FAST_TEST_MODE);
+    aon.s.test_mode = test_mode;
+    btaon_fast_write_safe(BTAON_FAST_TEST_MODE, aon.d16);
+
+    WDG_SystemReset(RESET_ALL_EXCEPT_AON, SWITCH_TEST_MODE);
+}
+
+static inline void reset_test_mode(void)
+{
+    T_BTAON_FAST_TEST_MODE_TYPE aon;
+    aon.d16 = btaon_fast_read_safe(BTAON_FAST_TEST_MODE);
+    aon.s.test_mode = NOT_TEST_MODE;
+    btaon_fast_write_safe(BTAON_FAST_TEST_MODE, aon.d16);
+}
+
+static inline bool is_test_mode_enable(void)
+{
+    uint32_t start_addr = flash_get_bank_addr(FLASH_BKP_DATA1);
+    if (start_addr)
+    {
+        uint32_t r_data = 0;
+        flash_auto_read_locked(start_addr, &r_data);
+        return r_data == TEST_MODE_FLAG_DEFAULT;
+    }
+    return false;
+}
+
+static inline bool test_mode_disable(void)
+{
+    bool retval = false;
+    uint32_t start_addr = flash_get_bank_addr(FLASH_BKP_DATA1);
+    if (start_addr)
+    {
+        retval = flash_auto_write_locked(start_addr, TEST_MODE_FLAG_DISABLE);
+    }
+    return retval;
+}
+
+void set_hci_mode_flag(bool enable);
+
+bool check_hci_mode_flag(void);
+
+static inline void switch_to_hci_mode(void)
+{
+    set_hci_mode_flag(true);
+    WDG_SystemReset(RESET_ALL_EXCEPT_AON, SWITCH_HCI_MODE);
+}
+
+#if (BUILD_DATATRANS == 1)
+void set_datatrans_patch_flag(bool enable);
+
+bool check_datatrans_patch_flag(void);
+#endif
+
+/** @} */ /* End of group TEST_MODE_Exported_Functions*/
+
+/** @} */ /* End of group TEST_MODE*/
+#ifdef __cplusplus
+}
+#endif
+
+#endif /* _TEST_MODE_H_ */
+